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Form Factor

40 Derwent Road
Leighton Buzzard
United Kingdom

Telephone : 01525 371972
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Article archive for Form Factor;

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      On-wafer device characterization test solution from Rohde & Schwarz (19/07/2022)

      Electronics & wireless T&M expert, Rohde & Schwarz (R&S) now offers a test solution for full RF performance characterization of the DUT on-wafer combining the R&S ZNA vector network analyzer with engineering probe systems from FormFactor. As a result, semiconductor manufacturers can perform reliable & repeatable on-wafer device characterization in the development phase, during product qualification & in production.