Marvin Test Solutions company details from EPDT Magazine

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Guide To Suppliers

Marvin Test Solutions

Web : http://www.marvintest.com/

Article archive for Marvin Test Solutions;

- PXI – 20 Years of growth and evolution (12/05/2017)
  
  20 years ago, National Instruments proposed a new standard, PXI (PCI eXtensions for Instrumentation), and the following year, the PXISA (PXI Systems Alliance) was established as responsible for managing the specification and evolution of the standard.
- Automate your test with ATEasy (24/08/2016)
  
  ATEasy’s Windows-compatible open-architecture supports all industry-standard HW and SW interfaces.
- ATEasy - Designed for automated test (16/08/2016)
  
  ATEasy was designed specifically for ATE systems. Extremely powerful, yet easy to use, with unrivaled long-term support.
- Reduce your time to test with ATEasy (09/08/2016)
  
  ATEasy’s RAD (Rapid Application Development) framework accelerates development, deployment and sustainment of ATE systems.
- PXI-based, advanced switching architecture for functional test (25/04/2016)
  
  Virtually all ATE systems employ a switching subsystem in order to route test system resources to multiple test points on the UUT.
- Advanced PXI digital subsystems address semiconductor test applications (20/04/2015)
  
  The on-going challenge for today’s test engineers is to identify and create new test systems that can offer significantly lower test costs as well as address the need for configurable, flexible test solutions that offer comparable features to proprietary ATE platforms at a much lower cost.

Guide To Suppliers

Marvin Test Solutions

PXI – 20 Years of growth and evolution (12/05/2017)

Automate your test with ATEasy (24/08/2016)

ATEasy - Designed for automated test (16/08/2016)

Reduce your time to test with ATEasy (09/08/2016)

PXI-based, advanced switching architecture for functional test (25/04/2016)

Advanced PXI digital subsystems address semiconductor test applications (20/04/2015)