Tektronix to showcase optical test at ECOC 2014
22 July 2014
Visitors the company stand will be offered hands-on demonstrations and technical advice as well as see some the new AWG7000.
The show will be held in Cannes, France September 21 to 25. On stand 495, visitors will be able to see the AWG70000 series arbitrary waveform generator that is claimed to offer the industry’s best combination of high sample rate, long waveform memory and deep dynamic range.
Bandwidth signals at baseband, IF and RF frequencies are up to 20GHz, with greater than -80dBc dynamic range. With up to 16Gsamples of waveform memory, it can generate unique signals that are long enough to simulate real world environments or make complex optical modulations such as PAM 4.
There will also be the OM4000 optical modulation analyser that offers automated test support for 400G multi-carrier coherent optical modulation and reduce test times for researchers working on 400G and faster coherent optical systems.
Pattern generators and bit error detectors to support optical and serial data communications testing on signals as fast as 40Gbit/s, will be on display together with demonstrations of PHY layer test solutions: eye diagrams and jitter performance, stressed receiver testing, crosstalk and BER tests and optical modulation analysis.
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