Large-format ionic cleanliness tester
23 January 2012
GEN3 has recently up-dated their line of ionic test systems with the addition of a large test chamber (24in x 24in x 3.6in) to the CM33 model
Ascentech LLC, the North American distributor for GEN3 Systems Ltd., will introduce and exhibit Gen3’s the new CM – Series Large-Format Ionic Cleanliness Test System, the first of its kind, at IPC/APEX 2012 in San Diego, California, between 28 February – 1 March 2012.
GEN3 has recently up-dated their line of ionic test systems with the addition of a large test chamber (24in x 24in x 3.6in) to the CM33 model.
All of the CM-Series testers include the following features:
• Fast (three minute) test time
• Full test cycle including regeneration time = < six minutes
• Solid gold measuring cell, ballistic amplifier providing a test accuracy of <0.005µS/cm
• Curve-fitting analysis algorithm (Merit of Fit)
• Two-year warranty
CM-Series testers utilise a solid gold test-cell, ballistic amplifiers, and high volume pumping systems to ensure superior measurement precision even at very low conductivity values. The high volume pumping system produces complete test solution change more than six times per minute, resulting in faster test times, more sensitive measurement, and superior surface contamination detection.
PC-based software is used to produce graphical test data, a pass/fail analysis, and automatic hard copy print-out using test methods according to the MIL and DEF standards. CM-Series testers measure in accordance with all international and MIL specifications IPC-J-STD 001 & IPC-TM-650, MIL-P-28809 (obsolete but still referenced), and DEF Standard 00-100/3.
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