Y.I.C. Technologies releases low-cost EMC troubleshooting solution ensuring EMC certification first time, every time
28 September 2022
Introducing Y.I.C. NFP (Near Field Probe) EMC troubleshooting solution, which will enhance your product testing with reliable & accurate live scanning for highlighting EMC/EMI issues. It will enable design engineers to get results quickly & easily. View findings in real-time using probe precision tracking right from your workbench.
Y.I.C. Technologies, developer of EMC/EMI (electromagnetic compatibility/electromagnetic interference) test & measurement solutions is introducing a low cost, affordable EMC/EMI troubleshooting solution. The NFPKit is developed to assist design engineers to rapidly diagnose & solve EMC/EMI challenges. The EMC certification process is costly & time consuming and with this low-cost pre-compliance solution, it will give businesses the opportunity to minimise risk at this critical stage.
“The EMC testing market is growing, and we are proud to offer an easy, accurate and reliable solution to address the needs of the small and mid-size companies. It is great to be part of this exciting release,” says Yoram Shimoni.
The EMC testing market offers services to ensure that the products adhere to quality, technical safety, and performing to regulatory standards. Testing is typically carried out in laboratories and manufacturing facilitates to improve the marketability of products and to lower the manufacturing costs in the pre-production phase. To ensure the goods comply with the buyer’s specifications, inspection services are offered for the examination of goods to end users. The EMC testing market is growing at a CAGR of 5.4% from USD 2.1 billion in 2019 to USD 2.8 billion in 2024.
Find out more at: https://yictechnologies.com/introducing-our-nfp-kit-near-field-probe-solution/
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