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      Accuracy in aerospace (18/07/2017)

      During the late 19th century, the Wright brothers began experimenting with  the concept of air travel. After years of research, observing the angle of birds’  wings and the engineering of bicycles and motors, they finally succeeded in 1903.

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      Testing MIPI interfaces with the R&S RTO oscilloscope (15/05/2017)

      Many components in modern smartphones communicate with each other via interfaces standardised by the MIPI Alliance. R&S RTO oscilloscopes can analyse these interfaces’ signal integrity and data content with maximum efficiency to quickly locate errors.

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      EMC Regulatory Compliance does not ensure functional safety (12/05/2017)

      One of the biggest problems faced by all electrical and electronic equipment is that of electromagnetic interference (EMI). However, what's peculiar is that, despite the rising use of devices that are susceptible to EMI, until recently there have been no clear guidelines for EMC as regards functional safety. Here, Keith Armstrong, worldwide EMC specialist at EMC Standards, looks at how engineers can ensure that EMI will not cause excessive functional safety risks.

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      A new approach to highly parallel wafer-level reliability systems (12/05/2017)

      With semiconductor content increasingly appearing in everything we use today, it is becoming even more important to ensure that semiconductor devices maintain their performance over a given lifetime. Reliability testing has long served as a method for semiconductor manufacturers to ensure this. Not only is the number of semiconductor devices growing, but their complexity is also increasing as innovative processes reduce device geometries and add integrated technologies, such as wireless connecti

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      Addressing Legacy Test System Replacement (12/05/2017)

      Companies and government entities continually struggle with ways to extend the life of their test equipment and systems. Military contracts require test support for the life of the program which can be a 15 to 20 year requirement. Similarly, high value, mission-critical electronic products which rely upon functional test also exhibit extended lifecycles.

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      Drive down the size and cost of test with PXI and AXIe (12/05/2017)

      Across many industries, manufacturers are transitioning from standalone benchtop instruments to modular test platforms. For some, the move towards modular is essential as they address the test challenges of multichannel technologies, cost and time-to-market.

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      PXI – 20 Years of growth and evolution (12/05/2017)

      20 years ago, National Instruments proposed a new standard, PXI (PCI eXtensions for Instrumentation), and the following year, the PXISA (PXI Systems Alliance) was established as responsible for managing the specification and evolution of the standard.

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      Impact of security trends on test equipment (03/04/2017)

      As organisations look to shore up their defences against cyber-security threats, special-purpose test systems present unique challenges. A test system that is compromised can have a significant impact on an organisation’s reputation and revenue, so it is reasonable to take steps to reduce that business risk.

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      DisplayPort over Type-C – Overcoming cable assembly test challenges (06/01/2017)

      Immediately after the release of the USB Type-C connector specification, VESA (Video Electronics Standards Association) readied the DisplayPort technology to operate as an Alternate Mode (Alt Mode) over this new connector.