Electronic Product Design & Test - Features

Features - Test/Measurement

Identifying RF interference sources with automatic IQ capture

The role of DevOps in electronics design and test

Accuracy in aerospace

Testing MIPI interfaces with the R&S RTO oscilloscope

EMC Regulatory Compliance does not ensure functional safety

A new approach to highly parallel wafer-level reliability systems

- Addressing Legacy Test System Replacement (12/05/2017)
  
  Companies and government entities continually struggle with ways to extend the life of their test equipment and systems. Military contracts require test support for the life of the program which can be a 15 to 20 year requirement. Similarly, high value, mission-critical electronic products which rely upon functional test also exhibit extended lifecycles.
- Drive down the size and cost of test with PXI and AXIe (12/05/2017)
  
  Across many industries, manufacturers are transitioning from standalone benchtop instruments to modular test platforms. For some, the move towards modular is essential as they address the test challenges of multichannel technologies, cost and time-to-market.
- PXI – 20 Years of growth and evolution (12/05/2017)
  
  20 years ago, National Instruments proposed a new standard, PXI (PCI eXtensions for Instrumentation), and the following year, the PXISA (PXI Systems Alliance) was established as responsible for managing the specification and evolution of the standard.
- Impact of security trends on test equipment (03/04/2017)
  
  As organisations look to shore up their defences against cyber-security threats, special-purpose test systems present unique challenges. A test system that is compromised can have a significant impact on an organisation’s reputation and revenue, so it is reasonable to take steps to reduce that business risk.
- DisplayPort over Type-C – Overcoming cable assembly test challenges (06/01/2017)
  
  Immediately after the release of the USB Type-C connector specification, VESA (Video Electronics Standards Association) readied the DisplayPort technology to operate as an Alternate Mode (Alt Mode) over this new connector.
- Time-correlated analysis of signals found in embedded designs (15/12/2016)
  
  The staggering need for cost-efficient and powerful communications and control electronics for industry, motor vehicles and the entertainment and smart home sector is driving the integration of electronic circuits.
- Throughput testing in TCP/IP based networks (15/12/2016)
  
  Communication networks have evolved greatly in recent years to the extent that all-IP wired and wireless hybrid networks are now a reality.
- Product complexity causes over testing (15/12/2016)
  
  As well as being fit for purpose and functional, products must be able to meet the applicable regulatory standards in order to be legally brought to market.
- How do you ensure that medical devices are functionally safe? (03/11/2016)
  
  Ensuring the functional safety of medical devices is critically important for designers and manufacturers as these devices can impact the health and wellbeing of the operators that use them and patients that rely on them.

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