32 Gb/s multi-channel BER testers for 100G network design & test
05 February 2013
Tektronix announced a new series of high-speed pattern generators and error detectors to support optical and serial data communications testing on signals as fast as 32 Gb/s.
The PPG3000 Series Pattern Generators and PED3000 Series Bit Error Detectors feature multi-channel pattern generation with channel-specific data programming ideal for critical margin testing on critical standards like 100G Ethernet, which require up to 4 channels.
For testing coherent optical modulation formats, such as DP-QPSK, the PPG3000 Series, with its 4 phase-aligned channels, can be used in conjunction with the Tektronix OM4000 Series Coherent Lightwave Signal Analyser to enable optical designers to optimise and validate coherent modulation formats in real-time.
For bit error rate testing, the PED3000 Series can be combined with the PPG3000 to provide up to 32 Gb/s BER analysis with multi-channel support for quick identification of crosstalk issues common in multi-lane data communications architectures. For example, with IEEE802.3ba standards test, designers can simulate a 4 x 28G test bench to stress-test their receivers’ designs. The 32 Gb/s data rate output with adjustable jitter insertion enables design firms to bring product to market with industry best margin capabilities, improving yields and performance of their end products or chips.
Multi-channel Pattern Generation
Consisting of six models in total, the PPG3000 Series includes models with 30 Gb/s or 32 Gb/s speeds and with one, two or four channels. With features such as synchronised and phase adjustable outputs and PRBS or user-defined pattern generation, these instruments provide the flexibility needed to troubleshoot a wide range of design issues including crosstalk. As speeds increase and multi-lane configurations such as 100G Ethernet become commonplace, crosstalk has emerged as a major design challenge.
Multi-channel BER Testing
Available with either one or two channels, the PED3000 Series of error detectors enable comprehensive testing of multi-channel standards like 100G Ethernet. The instruments combine excellent sensitivity (<20mV measured at 30 Gb/s) with the industry’s widest data range from 32 Mb/s to 32 Gb/s. Error checking functions include PRBS or user-defined patterns, DC-coupled differential data inputs, single-ended clock input and auto align to input pattern.
Working together as a fully integrated system, individually or in conjunction with other Tektronix instruments, the PPG3000 and PED3000 Series offer designers a wide range of data rates, patterns, stresses and output level to address a range of standards. Users can quickly configure tests on the fly using an easy-to-use touchscreen graphic user interface. This simple operation shortens training time and improves testing efficiency.
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