‘Plunge to board’ RF probe
18 June 2012
Everett Charles Technologies (ECT) now offers a variety of high-frequency, controlled-impedance, spring contact probes for broadband measurement applications.
Beginning decades ago with the development of the legendary K-50 product, ECT has continued to expand its product line to interface with the ever-expanding types of launch design patterns on contemporary PCBs.
The K-50 Series probes utilise independent probes arranged to effectively create a ground shield. The independent probes offer a tremendous advantage compared to cylindrical ground shield designs in that the probes can articulate to absorb much greater device-under-test (DUT) tolerances, fixture tolerances and flexure when used in ‘plunge-to-board’ test applications.
Each of the ground and signal probes are replaceable and feature an instrument grade Pogo pin architecture that is designed for up to 90% compression versus the 2/3rds compression limit of typical Pogo designs. The K-50 Series is designed to be used as a port extender for network analysers and can be used freehand or mounted in a test fixture as a modular component.
Additionally, the probes can be transferred to a new fixture upon revision or obsolescence of the DUT.
With highly repeatable measurement capabilities ranging from 4-12Ghz, the K-50 Series products offer a convenient off-the-shelf solution for reliable broadband measurements in high-volume manufacturing environments.
Standard or custom K-50 Series probes can be ordered from ECT directly or via distribution partners.
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