New category of analyser for advanced device characterisation
06 April 2016
Keysight Technologies introduced an analyser enabling a minimum of 100-pA level dynamic current measurements with a maximum of 200 MHz bandwidth.
The analyser also has 1 GSa/s sampling rate and 14- or 16-bit wide dynamic range. The Keysight CX3300 Series Device Current Waveform Analyser is a new category of instrument and is ideally suited for researchers struggling with high-speed transient current measurements during advanced device characterisation and engineers working to reduce power/current consumption in low-power devices.
Characterising advanced devices and evaluating low-power devices are challenging tasks; ones that require engineers to measure high-speed (over 1 MHz) and low-level dynamic current (below 1 µA). However, the existing methodology for this measurement is plagued by many issues – a large noise, voltage drop, limited dynamic range, bandwidth – and as a result, low-level dynamic current often goes undetected and unmeasured.
Keysight’s new CX3300 analyser overcomes this limitation by enabling the simultaneous measurement of wideband and low-level current waveforms. By providing a 14-bit or 16-bit wide dynamic measurement range, a single instrument can meet a wide range of measurement requirements without using multiple instruments. A graphical user interface on a WXGA 14.1” multi-touch display, and advanced measurement and analysis software, make previously difficult low-level current waveform measurements and analyses dramatically efficient and easier to make.
Masaki Yamamoto, general manager of Keysight’s Wafer Test Solutions in Industrial Solutions Group, said Keysight’s new CX3300 Series analyser stems from years of research and is in direct response to customers’ needs for low-level dynamic current measurements without compromising wide bandwidth. The CX3300, with its ability to measure wideband and low-level dynamic current, represents a significant breakthrough in meeting our customers’ needs. In addition to complementing the existing Keysight instrument portfolio, the new analyser provides customers with a more complete solution for device analysis.
Using the CX3300 analyser, researchers can now measure transient current even if the pulse width is very narrow (less than 100 ns). This capability is particularly beneficial for device engineers developing semiconductor or advanced memory devices, since it allows them to visualise previously unmeasurable waveforms. Current consumption waveforms can also be clearly captured at any point in time, whether the device is in its sleep/standby or active state. By being able to clearly see how a device consumes power, engineers are better able to quantitatively evaluate and reduce a device’s power/current consumption.
In addition to using the CX3300 analyser to measure dynamic current, the analyser can also be used as a debugging tool, enabling deep-dive and accurate evaluation during R&D. Doing so drastically increases R&D efficiency and accelerates the development process by shortening turn-around-time. Using the analyser, engineers are able to write more aggressive power consumption specifications, and in turn, realise more confident power reduction.
The CX3300 analyser consists of a mainframe with a WXGA 14.1” display and current sensors specifically dedicated to precision current waveform measurements. The mainframe features a 14-bit or 16-bit wide dynamic range, 200 MHz of maximum bandwidth, and a fast sampling rate of 1 GSa/s. The low noise and wideband current sensors support dynamic current measurements from 10 A down to 100 pA level.
More information about the CX3300 Series analyser is available at www.keysight.com/find/cx3300.
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